| 000 | 01207cam a22002894a 4500 | ||
|---|---|---|---|
| 005 | 20170210193255.0 | ||
| 008 | 041113s2000 nyua b 001 0 eng | ||
| 020 |
_a0471319317 (alk. paper) _c3825 Bht. |
||
| 040 | _aSPU | ||
| 049 | _bSPU-BK | ||
| 050 | 0 | 0 |
_aTK 7867 _bM68P 2000 |
| 100 | 1 |
_aMourad, Samiha. _991181 |
|
| 245 | 1 | 0 |
_aPrinciples of testing electronic systems / _cSamiha Mourad, Yervant Zorian. |
| 260 |
_aNew York : _bJohn Wiley & Sons, _c2000. |
||
| 300 |
_axix, 420 p. : _bill. ; _c25 cm. |
||
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aElectronic circuits _xTesting. _991182 |
|
| 650 | 0 |
_aELECTRONIC APPARATUS AND APPLIANCES _xTESTING. _934368 |
|
| 700 | 1 |
_aZorian, Yervant. _991183 |
|
| 856 | 4 | 2 |
_zContributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley045/99052179.html |
| 856 | 4 | 2 |
_zPublisher description _uhttp://www.loc.gov/catdir/description/wiley039/99052179.html |
| 856 | 4 |
_zTable of Contents _uhttp://www.loc.gov/catdir/toc/onix05/99052179.html |
|
| 942 | _cGEN | ||
| 998 | _aNuch 131104 | ||
| 999 | _c76207 | ||