000 00660nam0a22001810004500
005 20170210191936.0
020 _a007037602
050 0 0 _aTK 7878.4
_bL46M 1993
100 1 _aLenk, John D
_968832
245 1 0 _aMC Graw - Hill electronic testing Handbook : Proce
250 _aพิมพ์ครั้งที่ 1
260 _aNew York:
_bMc Graw - Hill, Inc.,
_c1993
500 _aIncludes index
650 0 _aElectronic instruments
_xHandbook, manuals
_968833
650 0 _aElectronic apparatus and applianees
_xTesting
_xHandbook, manuals
_968834
942 _cGEN
999 _c67232