TY  - DATA
AU  - Goldstein, Joseph,
AU  - Newbury, Dale E.
AU  - Michael, Joseph R.
AU  - Ritchie, Nicholas W. M.
AU  - Scott, John Henry J.
AU  - Joy, David C.,
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9781493966769 (E-book)
AV  - QH 212 S32 2018
PY  - 2018///
CY  - New York
PB  - Springer
KW  - SCANNING ELECTRON MICROSCOPY
N1  - Includes bibliographical references and index; Preface -- Scanning Electron Microscopy and Associated Techniques : Overview -- Electron Beam -- Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry : Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis : from k-ratio to Composition -- Quantitative analysis : the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
UR  - https://drive.google.com/file/d/1wn_9Dngw4POD4NRzEF-tjO2R8eNo6Dia/view?usp=sharing
ER  -