Scanning electron microscopy and x-ray microanalysis / [electronic resource]
Scanning electron microscopy and x-ray microanalysis / [electronic resource]
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
- Fourth edition
- New York : Springer, 2018
- 1 online resource (xxiii, 550 pages) : illustrations (some color)
Includes bibliographical references and index
Preface -- Scanning Electron Microscopy and Associated Techniques : Overview -- Electron Beam -- Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry : Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis : from k-ratio to Composition -- Quantitative analysis : the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
9781493966769 (E-book)
SCANNING ELECTRON MICROSCOPY
QH 212 / S32 2018
Includes bibliographical references and index
Preface -- Scanning Electron Microscopy and Associated Techniques : Overview -- Electron Beam -- Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry : Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis : from k-ratio to Composition -- Quantitative analysis : the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
9781493966769 (E-book)
SCANNING ELECTRON MICROSCOPY
QH 212 / S32 2018